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Signal and Power Integrity in Digital Systems TTL CMOS and BICMOS
by [Buchanan, James E]
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Description
This book provides guidance for addressing many of the critical signal and power integrity issues that designers of high-speed digital systems face. The fast switching edges of today's TTL, CMOS, and BiCMOS logic devices have introduced many new signal and power integrity problems and worsened most of the old ones, and as a result it is difficult to design and build cost-effective digital systems. The book's purpose is to help designers reach an understanding of the issues that must be addressed and provide practical engineering solutions.
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Product Details
- McGraw-Hill Brand
- Dec 19, 1995 Pub Date:
- 9780070087347 ISBN-13:
- 0070087342 ISBN-10:
- 400.0 pages Hardcover
- English Language
- 9.3 in * 1.12 in * 6.21 in Dimensions:
- 1 lb Weight:
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