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VLSI Test Principles and Architectures Design for Testability Morgan Kaufmann Series in Systems o

by [Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing]

$90.00

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Description

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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Product Details

  • Morgan Kaufmann Brand
  • Jun 1, 2006 Pub Date:
  • 9780123705976 ISBN-13:
  • 0123705975 ISBN-10:
  • 808.0 pages Hardcover
  • English Language
  • 9.38 in * 2.06 in * 8.12 in Dimensions:
  • 4 lb Weight: