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VLSI Test Principles and Architectures: Design for Testability

VLSI Test Principles and Architectures: Design for Testability

by Wang, Laung-Terng
No customer reviews yet ISBN 9780123705976 Morgan Kaufmann

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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BrandMorgan Kaufmann
Pub dateJun 1, 2006
ISBN-100123705975
ISBN-139780123705976
Hardcover808.0 pages
LanguageEnglish
Dimensions9.38 × 2.06 × 8.12 in
Weight4 lb
Last updated 2026-08-31 00:45
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