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Home/ Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162
Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162

Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers Volume 162

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Pub dateJun 30, 2010
ISBN-100123813166
ISBN-139780123813169
LanguageEnglish
Last updated 2026-08-29 03:51
$300.60
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