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Surface Infrared and Raman Spectroscopy: Methods and Applications (1995)
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Surface Infrared and Raman Spectroscopy: Methods and Applications (1995)

No customer reviews yet ISBN 9780306449635
Published
May 1995
Language
English
$114.64
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About this book

are intended to fill the gap between a manufacturer's handbook, and review articles that highlight the latest scientific developments. A fourth volume will deal with techniques for specimen handling, beam artifacts, and depth profiling. It will provide a compilation of methods that have proven useful for specimen handling and treatment, and it will also address the common artifacts and problems associated with the bombardment of solid sur- faces by photons, electrons, and ions. A description will be given of methods for depth profiling. Surface characterization measurements are being used increasingly in di- verse areas of science and technology. We hope that this series will be useful in ensuring that these measurements can be made as efficiently and reliably as possible. Comments on the series are welcomed, as are suggestions for volumes on additional topics. C. J. Powell Gaithersburg, Maryland A. W. Czandema Golden, Colorado D. M. Hercules Pittsburgh, Pennsylvania T. E. Madey New Brunswick, New Jersey J. T. Yates, Jr.

Specifications

PublishedMay 31, 1995
ISBN-100306449633
ISBN-139780306449635
LanguageEnglish

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