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Trap Level Spectroscopy in Amorphous Semiconductors
Trap Level Spectroscopy in Amorphous Semiconductors
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ISBN 9780323165037
Elsevier Science
- Published
- Jun 2010
- Language
- English
- Size
- 9.02 × 5.98 × 0.28 in
$190.88
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About this book
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.
Specifications
PublisherElsevier Science
PublishedJun 28, 2010
ISBN-100323165036
ISBN-139780323165037
Pages128
LanguageEnglish
Dimensions9.02 × 5.98 × 0.28 in
Weight0 lb
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