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High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography

by Bowen, D K
No customer reviews yet ISBN 9780367400637 CRC Press

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BrandCRC Press
Pub dateOct 10, 2019
ISBN-100367400634
ISBN-139780367400637
LanguageEnglish
Dimensions9.5 × 0.7 × 6.8 in
Weight1 lb
Last updated 2026-08-28 06:56
$99.05
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