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Scanning Microscopy for Nanotechnology: Techniques and Applications (2007)
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Description
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.
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Product Details
- Nov 27, 2006 Pub Date:
- 0387333258 ISBN-10:
- 9780387333250 ISBN-13:
- English Language
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