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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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ISBN 9780387465463
- Published
- Jun 2007
- Language
- English
$228.98
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Specifications
PublishedJun 21, 2007
ISBN-100387465464
ISBN-139780387465463
LanguageEnglish
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