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Electromigration and Electronic Device Degradation
Electromigration and Electronic Device Degradation
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ISBN 9780471584896
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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Pub dateJan 14, 1994
ISBN-100471584894
ISBN-139780471584896
LanguageEnglish
Last updated 2026-03-13 13:24
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