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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

by Zhong Lin Wang
No customer reviews yet ISBN 9780521482660
Published
May 1996
Language
English
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About this book

In this book, RHEED, REM and REELS techniques are comprehensively reviewed for the first time. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. The book is written for materials scientists and graduate students and is entirely self-contained. FORTRAN source codes are provided for calculating crystal structure data and electron energy-loss spectra in different scattering geometries.

Specifications

PublishedMay 23, 1996
ISBN-100521482666
ISBN-139780521482660
LanguageEnglish

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