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Neutron and X ray Reflectometry Emerging Phenomena at Heterostructure Interfaces

by [Basu, Saibal, Singh, Surendra]

$194.23

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Description

This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.

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Product Details

  • Iop Publishing Ltd Brand
  • Dec 27, 2022 Pub Date:
  • 9780750346931 ISBN-13:
  • 0750346930 ISBN-10:
  • 200.0 pages Hardcover
  • English Language
  • 10.06 in * 0.64 in * 7.35 in Dimensions:
  • 1 lb Weight: