Skip to content
Home/ Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (1998)
Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (1998)

Fundamental Aspects of Ultrathin Dielectrics on Si-Based Devices (1998)

No customer reviews yet ISBN 9780792350071

An extrapolation of ULSI scaling trends indicates that minimum feature sizes below 0.1 mu and gate thicknesses of Audience: Both expert scientists and engineers who wish to keep up with cutting edge research, and new students who wish to learn more about the exciting basic research issues relevant to next-generation device technology.

About the author

Product details

Pub dateMar 31, 1998
ISBN-100792350073
ISBN-139780792350071
LanguageEnglish
Last updated 2026-03-18 13:19
$177.01
In stock — ships in 24 hours with free tracking
Delivery by Wednesday, September 16, 2026
Qty
Sign in to Add to Saved list
Free delivery on orders over $35.
15-day returns. Any reason.
Secure checkout. We never store card details.

Readers who bought this also bought

More from Electronics - Semiconductors
See all
Semiconductor Heterojunctions and Nanostructures
Manasreh, Omar
$211.32
Fabless Semiconductor Implementation
Kumar, Rakesh
$159.35
Switch-Mode Power Supplies, Second Edition: Spice Simulations and Practical Designs (Revised)
Basso, Christophe P
$180.14
Semiconductor Physics and Devices: Basic Principles
Neamen, Donald A
$297.08
Nitrides and Related Wide Band Gap Materials, 87
F a Ponce
$225.00
Dilute Nitride Semiconductors
Henini, Mohamed
$319.37