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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxf
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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxf

No customer reviews yet ISBN 9780854981786 CRC Press
Published
Oct 1987
Language
English
Size
9.21 × 1.69 × 6.14 in
$243.54
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Specifications

PublisherCRC Press
PublishedOct 1, 1987
ISBN-100854981780
ISBN-139780854981786
LanguageEnglish
Dimensions9.21 × 1.69 × 6.14 in
Weight3 lb

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