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(Ipf)Microelectronic Reliability

(Ipf)Microelectronic Reliability

by Hakim, Edward B
No customer reviews yet ISBN 9780890062845

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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Pub dateJan 31, 1989
ISBN-100890062846
ISBN-139780890062845
LanguageEnglish
Last updated 2026-03-10 21:37
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