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Microelectronic Reliability: Integrity Assessment and Assurance

Microelectronic Reliability: Integrity Assessment and Assurance

by Pollino, Emiliano
No customer reviews yet ISBN 9780890063507

A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi

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Pub dateApr 1, 1989
ISBN-100890063508
ISBN-139780890063507
LanguageItalian
Last updated 2026-03-10 21:37
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