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Elements of Electromigration: Electromigration in 3D IC technology
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Published
Dec 26, 2025
ISBN-13
9781032470283

Elements of Electromigration: Electromigration in 3D IC technology

by Tu, King-Ning
No customer reviews yet ISBN 9781032470283

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

Product details

Pub dateDec 26, 2025
ISBN-101032470283
ISBN-139781032470283
LanguageEnglish
Last updated 2026-09-30 09:41
$77.22
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