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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (2003)

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (2003)

by Nicolici, Nicola
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Pub dateFeb 28, 2003
ISBN-10140207235X
ISBN-139781402072352
LanguageEnglish
Last updated 2026-09-21 01:17
$114.64
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