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VLSI Test Principles and Architectures Design for Testability
by [Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing]
$90.00
Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now available.
. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now available.
. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."
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Product Details
- Morgan Kaufmann Brand
- Jul 21, 2006 Pub Date:
- 9781493300860 ISBN-13:
- 1493300865 ISBN-10:
- 808.0 pages Paperback
- English Language
- 9.35 in * 1.83 in * 7.5 in Dimensions:
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