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Failure Analysis High Technology Devices De Gruyter STEM

by [Sullivan, Daniel J. D., Carleton, Eric J.]

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Description

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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Product Details

  • De Gruyter Brand
  • Oct 24, 2022 Pub Date:
  • 9781501524783 ISBN-13:
  • 150152478X ISBN-10:
  • 128.0 pages Perfect Paperback
  • English Language
  • 9.61 in * 0.28 in * 6.69 in Dimensions:
  • 0 lb Weight: