Skip to content
Home/ Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (2004)
Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (2004)

Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (2004)

No customer reviews yet ISBN 9783540206620

About the author

Product details

Pub dateApr 6, 2004
ISBN-103540206620
ISBN-139783540206620
LanguageEnglish
Last updated 2026-09-18 19:29
$177.01
In stock — ships in 24 hours with free tracking
Delivery by Monday, October 5, 2026
Qty
Sign in to Add to Saved list
Free delivery on orders over $35.
15-day returns. Any reason.
Secure checkout. We never store card details.