Skip to content
Home/ Applied Scanning Probe Methods IV: Industrial Applications (2006)
Applied Scanning Probe Methods IV: Industrial Applications (2006)
Save Ask us

Applied Scanning Probe Methods IV: Industrial Applications (2006)

No customer reviews yet ISBN 9783540269120
Published
Feb 2006
Language
English
$114.64
In stock
Most orders arrive within 3 weeks. Shipping policy
Qty
Sign in to Add to Saved list
Free delivery over $35 · 15-day returns

Condition

Brand New

An unread, unused copy: no writing or highlighting, and no missing or damaged pages. Every book we sell is brand new, including our lowest-priced titles.

About this book

Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.

Specifications

PublishedFeb 22, 2006
ISBN-103540269126
ISBN-139783540269120
LanguageEnglish

Buying from Saanjhi

  • Ships from the USA. Delivery to US addresses only.
  • Free delivery on orders over $35.
  • 15-day returns. Unless we send the wrong book or it arrives damaged, you pay return shipping and a 15% restocking fee.
  • Secure checkout. We never store card details.

Readers who bought this also bought

More from Nanotechnology & MEMS
See all