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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Ro

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Ro

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Pub dateAug 4, 2006
ISBN-103540284052
ISBN-139783540284055
LanguageEnglish
Last updated 2026-07-20 16:13
$228.98
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