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Nanoscale Spectroscopy and Its Applications to Semiconductor Research (2002)

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Description

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

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Product Details

  • Jul 19, 2002 Pub Date:
  • 3540433120 ISBN-10:
  • 9783540433125 ISBN-13:
  • English Language