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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (200

Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (200

by Waseda, Yoshio
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Pub dateSep 11, 2002
ISBN-103540434437
ISBN-139783540434436
LanguageEnglish
Last updated 2026-08-31 03:44
$228.98
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