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Formal Methods in Computer-Aided Design: Second International Conference, Fmcad '98, Palo Alto, Ca,

Formal Methods in Computer-Aided Design: Second International Conference, Fmcad '98, Palo Alto, Ca,

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This volumecontains the proceedingsof the Second InternationalConferenceon Formal Methods in Computer-Aided Design (FMCAD'98), organized November 4-6, in Palo Alto, California, USA. The rst event of this series was organized byMandayamSrivasand Albert Camilleriin 1996 inPaloAlto. FMCAD, which evolved from the series Theorem Provers in Circuit Design (TPCD), strives to beapremierforumfordisseminatingresearchinFormalVeri cation(FV) me- ods for digital circuits and systems, including processors, custom VLSI circuits, microcode, andreactivesoftware.Inadditiontosigni cantcase-studiesandve- cationapproaches, FMCADalsoendeavorstorepresentadvancesinthedriving technologies for veri cation, including binary decision diagrams, model che- ing, symbolicreasoning(theorem proving), symbolicsimulation, andabstraction methods. Theconferenceincludedfourinvitedlectures.Theinvitedlecturesweregiven by Kenneth McMillan (Cadence Berkeley Labs) on Minimalist proof assistants: interactions of technology and methodology in formal system level veric ation, by Carl-Johan Seger on Formal methods in CAD from an industrial perspective, by Randal E. Bryant and Bwolen Yang on A performance study of BDD-based model checking, and by Amir Pnueli on Veric ation of data-insensitive circuits: an in-order-retirement case study. Of the 55 regular paper submissionsreceived, 27 were selected by the technical program committee for presentation at the conference. All four tools papers received were also selected. We gratefully acknowledge the services of the technical program comm- tee of FMCAD'98, which consisted of Adnan Aziz (Univ. of Texas at Austin, USA), AlanHu(Univ.ofBritishColumbia, Canada), Albert Camilleri(Hewlett- Packard, USA), CarlPixley(Motorola, USA), CarlosDelgadoKloos (Univ. C- los III de Madrid, Spain), Ching-TsunChou (Intel, USA), EduardCerny (Univ.

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Pub dateOct 21, 1998
ISBN-103540651918
ISBN-139783540651918
LanguageEnglish
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