Skip to content
Home/ Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and Reram (2020)
Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and Reram (2020)

Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and Reram (2020)

by Nagata, Takahiro
No customer reviews yet ISBN 9784431548492 Springer

About the author

Product details

BrandSpringer
Pub dateMay 22, 2020
ISBN-104431548491
ISBN-139784431548492
LanguageEnglish
Dimensions9.25 × 0.24 × 6.1 in
Weight1 lb
Last updated 2026-09-12 14:38
$57.47
In stock — ships in 24 hours with free tracking
Delivery by Friday, October 16, 2026
Qty
Sign in to Add to Saved list
Free delivery on orders over $35.
15-day returns. Any reason.
Secure checkout. We never store card details.

Readers who bought this also bought

More from Electronics - Semiconductors
See all
Semiconductor Heterojunctions and Nanostructures
Manasreh, Omar
$211.32
Fabless Semiconductor Implementation
Kumar, Rakesh
$159.35
Switch-Mode Power Supplies, Second Edition: Spice Simulations and Practical Designs (Revised)
Basso, Christophe P
$180.14
Fundamentals of Semiconductor Devices
Anderson, Betty Lise
$298.12
Semiconductor Physics and Devices: Basic Principles
Neamen, Donald A
$297.08
Nitrides and Related Wide Band Gap Materials, 87
F a Ponce
$225.00