Skip to content
Home/ Ellipsometry: Principles and Techniques for Materials Characterization
Ellipsometry: Principles and Techniques for Materials Characterization

Ellipsometry: Principles and Techniques for Materials Characterization

No customer reviews yet ISBN 9789535136231

Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.

About the author

Product details

Pub dateNov 29, 2017
ISBN-109535136232
ISBN-139789535136231
LanguageEnglish
Last updated 2026-03-07 17:19
$134.57 $155.00 13% off
You save $20.43 · list price $155.00
In stock — ships in 24 hours with free tracking
Delivery by Monday, September 14, 2026
Qty
Sign in to Add to Saved list
Free delivery on orders over $35.
15-day returns. Any reason.
Secure checkout. We never store card details.