Home/
Test Generation of CrossTalk Delay Faults in VLSI Circuits (2019)
Test Generation of CrossTalk Delay Faults in VLSI Circuits (2019)
No customer reviews yet
ISBN 9789811324925
- Published
- Oct 2018
- Language
- English
$166.61
In stock
Most orders arrive within 3 weeks. Shipping policy
Sign in to Add to Saved list
Fast checkout
Pay with Apple Pay or Google Pay when available.
Payment received
We are registering your order now. Please stay on this page while we redirect you to the confirmation page.
Free delivery over $35 · 15-day returns
Condition
Brand New
An unread, unused copy: no writing or highlighting, and no missing or damaged pages. Every book we sell is brand new, including our lowest-priced titles.
Specifications
PublishedOct 10, 2018
ISBN-109811324921
ISBN-139789811324925
LanguageEnglish
Buying from Saanjhi
- Ships from the USA. Delivery to US addresses only.
- Free delivery on orders over $35.
- 15-day returns. Unless we send the wrong book or it arrives damaged, you pay return shipping and a 15% restocking fee.
- Secure checkout. We never store card details.
Readers who bought this also bought
More from Electronics - Circuits - General